Wafer Level Test
AC and DC Electronic load Model 63800 series
- Simultaneous double side color inspection
- 6" wafer / 8" inspection area
- Automatic wafer alignment
- Wafer shape / edge identification
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Photonics Wafer Probing Test System Model 58635 Series
- Up to 6" wafer
- Wide range and precise temperature control
- Support both pulse and CW operation
- LIV test, Near Field test, Far Field test
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